Surface Profilometry is a measurement technique that belongs to the class of surface characterization methods, distinguished by its quantitative determination of the spatial variations in surface height to characterize surface topography with high resolution.
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Sichuan University
Chengdu, China
21 h-index
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University of Huddersfield
Huddersfield, United Kingdom
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47 publications
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Rzeszów University of Technology
Rzeszów, Poland
15 h-index
33 publications
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National Physical Laboratory
London, United Kingdom
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37 publications
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Huazhong University of Science and Technology
Wuhan, China
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50 publications
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Centre National de la Recherche Scientifique
Paris, France
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82 publications
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Xi'an Jiaotong University
Xi'an, China
14 h-index
55 publications
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University of Warwick
Coventry, United Kingdom
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- Applied Optics
86 publications · 8.3K citations
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69 publications · 3K citations
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- Optics and Lasers in Engineering
57 publications · 3.4K citations
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- Measurement Science and Technology
45 publications · 1.8K citations
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- Optical Engineering
33 publications · 1.1K citations
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