Profilometry

Profilometry is a metrological technique that quantitatively characterizes surface topography by measuring the vertical displacement of a probe or optical signal across a material’s surface to determine its roughness, waviness, and form at micro- and nanoscale resolutions.

1.2K

Publications

53.1K

Citations

3.6K

Authors

1.1K

Institutions

Publications per year

2017–2026

380

Authors

3.6K

  1. QC
    Qian Chen

    Nanjing University of Science and Technology, China

    20 publications · 2.2K citations

    19

    h-index

  2. CZ
    Chao Zuo

    Nanjing University of Science and Technology, China

    20 publications · 2.2K citations

    19

    h-index

  3. YC
    Yiping Cao

    Sichuan University, China

    27 publications · 945 citations

    19

    h-index

  4. SF
    Shijie Feng

    Nanjing University of Science and Technology, China

    18 publications · 2K citations

    18

    h-index

  5. XS
    Xianyu Su

    Sichuan University, China

    22 publications · 1.1K citations

    18

    h-index

1–5 of 3.6K

Venues

  1. Applied Optics

    89 publications · 8.7K citations

    42

    h-index

  2. Optics Express

    97 publications · 4.3K citations

    39

    h-index

  3. Optics and Lasers in Engineering

    79 publications · 4.5K citations

    37

    h-index

  4. Optical Engineering

    41 publications · 1.3K citations

    22

    h-index

  5. Optics Letters

    34 publications · 1.5K citations

    20

    h-index

1–5