Profilometry
Profilometry is a metrological technique that quantitatively characterizes surface topography by measuring the vertical displacement of a probe or optical signal across a material’s surface to determine its roughness, waviness, and form at micro- and nanoscale resolutions.
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Institutions
Publications per year
2017–2026
380
1.2K
Optimization of surface micromorphology for enhanced osteoblast responses in vitro
Bowers Kt, Keller Jc, Randolph Ba et al. · Implant Dentistry · 1993 · 484 citations
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Sichuan University
Chengdu, China
30 h-index
243 publications
9.2K citations
Nanjing University of Science and Technology
Nanjing, China
23 h-index
132 publications
14.7K citations
Nanyang Technological University
Singapore, Singapore
17 h-index
32 publications
3.7K citations

Centre National de la Recherche Scientifique
Paris, France
17 h-index
95 publications
3.5K citations

Huazhong University of Science and Technology
Wuhan, China
16 h-index
57 publications
2.2K citations

University of Wollongong
Wollongong, Australia
16 h-index
65 publications
2.2K citations

Xi'an Jiaotong University
Xi'an, China
15 h-index
69 publications
1.6K citations

Shanghai University
Shanghai, China
14 h-index
34 publications
1.2K citations
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89 publications · 8.7K citations
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97 publications · 4.3K citations
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79 publications · 4.5K citations
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41 publications · 1.3K citations
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34 publications · 1.5K citations
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