Surface Science · 1984 · 50 citations · 7 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportCurrent-voltage CharacteristicsDevice ModelingMetal-oxide-semiconductor Field-effect TransistorsSemiconductor PhysicsSilicon MaterialsElectrical Transport PropertiesGate Oxide Thickness EffectsSiliconSilicon Electrical PropertiesSilicon Physics
7
Electronic properties of two-dimensional systems
Tsuneya Ando, A. B. Fowler, Frank Stern · Reviews of Modern Physics · 1982 · 7.4K citations
Natural Sciences, Chemistry, Physics +16
Resonance tunneling and localization spectroscopy
M. Ya. Azbel · Solid State Communications · 1983 · 151 citations