Semiconductor Science and Technology · 2013 · 49 citations · 30 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsSemiconductor MaterialsSurface ScienceEtching ProcessesPorosity CharacterizationPorous MaterialsSemiconductor InterfacesSemiconductor SurfacesSurface CharacterizationCurrent DensityDevice FabricationEtchingOptical PropertiesPorous Silicon CarbideScanning Electron MicroscopySilicon CarbideSurface Optical Properties
Porous silicon carbide (PSC) was successfully synthesized via electrochemical etching of an n-type hexagonal silicon carbide (6H-SiC) substrate using various current densities. The cyclic voltammograms of SiC dissolution show that illumination is required for the accumulation of carriers at the surface, followed by surface oxidation and dissolution of the solid. The morphological and optical characterizations of PSC were reported. Scanning electron microscopy results demonstrated that the current density can be considered an important etching parameter that controls the porosity and uniformity of PSC; hence, it can be used to optimize the optical properties of the porous samples.
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Direct observation of porous SiC formed by anodization in HF
Joseph Shor, I. Grimberg, Ben-Zion Weiss et al. · Applied Physics Letters · 1993 · 162 citations
Natural Sciences, Materials Engineering, Materials Science +16
Raman scattering characterization on SiC
Hiroshi Harima · Microelectronic Engineering · 2005 · 115 citations