Raman scattering characterization on SiC

Raman Investigation of SiC Polytypes

Satοru Nakashima, Hisatomo Harima · physica status solidi (a) · 1997 · 916 citations

Natural Sciences, Materials Science, Physics +17

The Physics of Ohmic Contacts to SiC

J. Crofton, Lisa M. Porter, John R. Williams · physica status solidi (b) · 1997 · 195 citations

Engineering, Materials Engineering, Materials Science +15

Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si

Stefan Zollner, J. G. Chen, E. Duda et al. · Journal of Applied Physics · 1999 · 94 citations

Natural Sciences, Materials Science, Physics +17

Dielectric function and reflectivity of 3C–silicon carbide and the component perpendicular to the <i>c</i> axis of 6H–silicon carbide in the energy region 1.5–9.5 eV

S. Logothetidis, J. Petalas · Journal of Applied Physics · 1996 · 85 citations

Natural Sciences, Materials Engineering, Materials Science +17

Raman study on the Ni/SiC interface reaction

Eiji Kurimoto, Hisatomo Harima, Tadao Toda et al. · Journal of Applied Physics · 2002 · 79 citations

Engineering, Materials Engineering, Materials Science +17