Bell System Technical Journal · 1955 · 72 citations · 11 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesAvalanche ProcessesComplementary Metal-oxide-semiconductor TechnologyIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsSemiconductor Device MaterialsAvalanche BreakdownAvalanche EffectAvalanche MultiplicationBreakdown MechanismsBreakdown VoltageJunction BreakdownJunction Field-effect TransistorsSemiconductor Junctions
A new device, the avalanche transistor, is described. Its properties derive from the utilization of the multiplication inherent in the breakdown process of reverse-biased semiconductor junctions. These junction transistors have regions of designable alpha greater than unity and are similar in many respects to point-contact and hook-collector transistors. They should, however, have advantages in speed and designability. Large regions of negative resistance of moderate magnitude can also be obtained in appropriate circuits. The device should find wide application in both switching and transmission. Design information for avalanche transistors is given.
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Large-Signal Behavior of Junction Transistors
J. Ebers, J.L. Moll · Proceedings of the IRE · 1954 · 604 citations
Avalanche Breakdown in Silicon
K. G. McKay · Physical Review · 1954 · 478 citations
Electron Multiplication in Silicon and Germanium
K. G. McKay, K. B. McAfee · Physical Review · 1953 · 326 citations
Drift Mobilities in Semiconductors. I. Germanium
M. B. Prince · Physical Review · 1953 · 317 citations