Light elements depth-profiling using time-of-flight and energy detection of recoils

Technique for profiling 1H with 2.5-MeV Van de Graaff accelerators

Barney L. Doyle, P. S. Peercy · Applied Physics Letters · 1979 · 274 citations

Engineering, Nuclear Engineering, Physics +17

The use of 6Li and 35Cl ion beams in surface analysis

J. L’Ecuyer, C. Brassard, C. Cardinal et al. · Nuclear Instruments and Methods · 1978 · 127 citations

Natural Sciences, Chemistry, Materials Science +14

Time-of-flight system for profiling recoiled light elements

R. Groleau, S. C. Gujrathi, J.P. Martin · Nuclear Instruments and Methods in Physics Research · 1983 · 125 citations

Engineering, Aerospace Engineering, Physics +9

On the determination of optimum depth-resolution conditions for rutherford backscattering analysis

J. S. Williams, W. Möller · Nuclear Instruments and Methods · 1978 · 92 citations

Natural Sciences, Earth Sciences, Physics +6

A time-zero detector utilizing isochronous transport of secondary electrons

A. M. Zebelman, Wilfried Meyer, K. Halbach et al. · Nuclear Instruments and Methods · 1977 · 77 citations · Full text

Engineering, Electrical Engineering, Physics +16