S. C. Gujrathi

Time-of-flight system for profiling recoiled light elements

R. Groleau, S. C. Gujrathi, J.P. Martin · Nuclear Instruments and Methods in Physics Research · 1983 · 125 citations

Engineering, Aerospace Engineering, Physics +9

Characterization of titanium nitride thin films

Han Wu, T.C. Chou, Anoop Kumar Mishra et al. · Thin Solid Films · 1990 · 117 citations

Natural Sciences, Materials Engineering, Materials Science +12

Effect of rapid thermal annealing on both the stress and the bonding states of <i>a</i>-SiC:H films

My Alı El Khakani, Mohamed Chaker, A. Jean et al. · Journal of Applied Physics · 1993 · 100 citations

Natural Sciences, Materials Engineering, Materials Science +17

A study of the effect of composition on the microstructural evolution of a–Si_<i>x</i>C₁−_<i>x</i>: H PECVD films: IR absorption and XPS characterizations

E. Gat, My Alı El Khakani, Mohamed Chaker et al. · Journal of materials research/Pratt's guide to venture capital sources · 1992 · 83 citations

Natural Sciences, Materials Engineering, Materials Science +12

Microstructure of plasma-deposited SiO2/TiO2 optical films

Stéphane Larouche, H. Szymanowski, J.E. Klemberg-Sapieha et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2004 · 69 citations

Natural Sciences, Materials Engineering, Materials Science +17