Concepedia

Time-of-flight system for profiling recoiled light elements

R. Groleau, S. C. Gujrathi, J.P. Martin

Nuclear Instruments and Methods in Physics Research · 1983 · 125 citations · 10 references

DOI

Concepts

References

10

Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

G. Amsel, J. P. Nadai, E. d'Artemare et al. · Nuclear Instruments and Methods · 1971 · 442 citations

, , +6

Profiling hydrogen in materials using ion beams

J. F. Ziegler, Chih-Wei Wu, Peter Williams et al. · Nuclear Instruments and Methods · 1978 · 203 citations · Full text

, , +10

A calibration procedure for the response of silicon surface-barrier detectors to heavy ions

S. Kaufman, E. P. Steinberg, B. D. Wilkins et al. · Nuclear Instruments and Methods · 1974 · 184 citations

, , +16

Identification of Nuclear Particles

F.S. Goulding, B G Harvey · Annual Review of Nuclear Science · 1975 · 129 citations · Full text

, , +9

The use of 6Li and 35Cl ion beams in surface analysis

J. L’Ecuyer, C. Brassard, C. Cardinal et al. · Nuclear Instruments and Methods · 1978 · 127 citations

, , +14