Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

The electrical properties of polycrystalline silicon films

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Kelvin probe force microscopy

M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe · Applied Physics Letters · 1991 · 2.3K citations

High Resolution, Engineering, Microscopy +16

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Organic Devices, Engineering, Organic–organic Interfaces +21

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Engineering, Chemistry, Solid State +21

Orientation-dependent ionization energies and interface dipoles in ordered molecular assemblies

Steffen Duhm, Georg Heimel, Ingo Salzmann et al. · Nature Materials · 2008 · 613 citations · Full text

Physics, Natural Sciences, Molecular Self-assembly +5