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Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures

Materials ScienceLed HeterostructuresSolid-state LightingEngineeringElectron MicroscopyCrystalline DefectsMicroscopyOptical PropertiesMicroscopy MethodOptoelectronic MaterialsApplied PhysicsAppropriate ToolScanning Force MicroscopyScanning Probe MicroscopyOptoelectronic DevicesElectrical CharacterisationOptoelectronics