Concepedia

Publication | Closed Access

A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design

DOI

183

Citations

16

References

2010

Year

R. M. Tromp, J. B. Hannon, A. W. Ellis, Weishi Wan, A Berghaus, O. Schaff
Ultramicroscopy

References

YearCitations

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