O. Schaff

A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design

R. M. Tromp, J. B. Hannon, A. W. Ellis et al. · Ultramicroscopy · 2010 · 183 citations

Engineering, Physics, Calibration +6

A photoelectron diffraction study of ordered structures in the chemisorption system Pd{111}-CO

T. Gießel, O. Schaff, Carol J. Hirschmugl et al. · Surface Science · 1998 · 145 citations

Inorganic Chemistry, Engineering, Surface Chemistry +9

Determination of the local structure of glycine adsorbed on Cu(110)

Nicholas Booth, D.P. Woodruff, O. Schaff et al. · Surface Science · 1998 · 144 citations

Materials Science, Local Structure, Engineering +4

The new ambient-pressure X-ray photoelectron spectroscopy instrument at MAX-lab

Joachim Schnadt, Jan Knudsen, Jesper N. Andersen et al. · Journal of Synchrotron Radiation · 2012 · 140 citations · Full text

XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT

Thomas Schmidt, U. Groh, R. Fink et al. · Surface Review and Letters · 2002 · 96 citations

Engineering, Energy Efficiency, Microscopy +21