Japanese Journal of Applied Physics · 1973 · 20 citations · 1 references
EngineeringMaterials EngineeringMaterials ScienceCrystal StructureMaterials ChemistrySemiconductor MaterialsEpitaxial GrowthSemiconductor Crystal GrowthSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsSemiconductor SurfacesCarrier GasesEpitaxial MaterialsHexagonal ArchitectureSilicon
Single crystal of lower boron phosphide (B13P2) with hexagonal structure was obtained hetero-epitaxially on silicon substrate. Diborane (B2H6) and phosphine (PH3) diluted in hydrogen were used as reactant gases. The substrate temperatures were between 1050°C and 1250°C and the molecular ratio of reactants to carrier hydrogen was below 3.2×10-4. The epitaxial relations were: B13P2(110)/Si(100), B13P2(110)/Si(110) and B13P2(100)/Si(111). The lower boron phosphide was a transparent film and its resistivity was measured as 1×108 Ω-cm at room temperature.
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Optical Absorption, Electroluminescence, and the Band Gap of BP
R. J. Archer, R. Y. Koyama, E. E. Loebner et al. · Physical Review Letters · 1964 · 140 citations
Natural Sciences, Materials Engineering, Materials Science +14