Interfacial states spectrum of a metal-silicon junction

The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique

E. H. Nicollian, A. Goetzberger · Bell System Technical Journal · 1967 · 1.8K citations

Engineering, Electrical Engineering, Materials Science +17

Determination of the density and the relaxation time of silicon-metal interfacial states

C. Barret, A. Vapaille · Solid-State Electronics · 1975 · 69 citations

Natural Sciences, Materials Science, Physics +14

Characterization of the interface states at a Ag/Si interface from capacitance measurements

A. Deneuville · Journal of Applied Physics · 1974 · 68 citations

Engineering, Electrical Engineering, Materials Science +17

Surface States on Clean and on Cesium‐Covered Cleaved Silicon Surfaces

Winfried Mönch · physica status solidi (b) · 1970 · 65 citations

Natural Sciences, Materials Science, Physics +17

Surface-state spectra from thick-oxide MOS tunnel junctions

T.P. Ma, R. C. Barker · Solid-State Electronics · 1974 · 50 citations

Natural Sciences, Materials Engineering, Materials Science +14