Publication | Closed Access
Roughness analysis of optical films and substrates by atomic force microscopy
67
Citations
18
References
1996
Year
Materials ScienceAtomic Force MicroscopyOptical FilmsEngineeringMicroscopyOptical PropertiesMicrofabricationSurface ScienceApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyRoughness AnalysisNanometrologyThin FilmsNanotribology
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