Kelvin probe force microscopy of C₆₀ on metal substrates: towards molecular resolution

Abstract

Surface workfunction changes upon C60 adsorption onto different metal single crystals are investigated by Kelvin probe force microscopy (KPFM). Literature values for similar metal/organic systems, showing a broad variation for both the measured metal workfunction and workfunction change, are compared to the acquired KPFM values. Good agreement is found between nanoscopic KPFM results and macroscopic photoelectron spectroscopy or Kelvin probe literature data. The model of a linear dependence between the metal substrate workfunction and the C60-induced workfunction change is confirmed. Former numerical simulations predicted a lateral quantitative KPFM resolution in the range of 10 nm, in this work results are published that show the achievement of this resolution with Cr coated, sharp tips. Furthermore, numerical simulations are presented that show the possibility of molecular contrast for KPFM.