Statistics
Publications
43
Citations
2.7K
H-Index
25
Active since
1988
S. Grafström is an author at Technische Universität Dresden specializing in engineering, applied physics, and physics.
Publications per year
1988–2015
43
43
Accuracy and resolution limits of Kelvin probe force microscopy
Ulrich Zerweck, Christian Loppacher, Tobias Otto et al. · Physical Review B · 2005 · 426 citations
Photoassisted scanning tunneling microscopy
S. Grafström · Journal of Applied Physics · 2002 · 209 citations
Engineering, Stm Tip, Physics +12
The role of topography and friction for the image contrast in lateral force microscopy
S. Grafström, Marcus Neitzert, Thomas Hagen et al. · Nanotechnology · 1993 · 89 citations
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