An image-shearing speckle-pattern interferometer for measuring bending moments

JA Leendertz, J.N. Butters

Journal of Physics E Scientific Instruments · 1973 · 293 citations · 4 references

Concepts

Abstract

The surface to be studied is illuminated with laser light and two images are formed, displaced relative to one another in the image. Speckle pattern interferometry is used to measure phase changes between the two images resulting from deformation of the surface. A fringe system is obtained showing contours of constant slope resolved in the direction of image displacement. A comparison is made with result obtained by holographic interferometry.

References

4