Future Device Modeling Trends

David E. Root

IEEE Microwave Magazine · 2012 · 109 citations · 30 references

Concepts

TL;DR

Good transistor models are essential for efficient CAD of nonlinear microwave and RF circuits, MMICs, power amplifiers, and nonlinear RF systems, and the increasingly complex demands of semiconductor technologies such as GaAs pHEMTs, InP DHBTs, SOI, LDMOS, and GaN HFETs, along with rapid development of new materials like GaN, challenge conventional compact modeling approaches. The authors seek to meet the increased accuracy and generality demands of modern communication signals and rapidly evolving semiconductor technologies by exploring advanced nonlinear device modeling techniques. The article reviews advanced nonlinear device modeling techniques developed in response to these challenges.

Abstract

Good transistor models are essential for efficient computer-aided-design (CAD) of nonlinear microwave and RF circuits, monolithic microwave integrated circuits (MMICs), power amplifiers (PAs), and nonlinear RF systems. Increasingly complicated demands of the various semiconductor technologies (e.g., GaAs pHEMTs, InP double heterojunction bipolar transistors (DHBTs), silicon on insulator (SOI), LDMOS, GaN HFETs, etc. ), and their applications in terms of power and frequency of operation and complexity of applied signals (e.g., modern communication signals with high peak-toaverage ratios) have placed commensurate requirements on the accuracy and generality of the device models used for design. New semiconductor material systems (e.g., GaN) have been developing at such a fast rate that conventional compact modeling approaches may not be able to keep up. These and other challenges have spawned much research into the advanced nonlinear device modeling techniques that are the focus of this article.

References

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