Ion beam lithography for direct patterning of high accuracy large area X-ray elements in gold on membranes

TEM Sample Preparation and FIB-Induced Damage

Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino et al. · MRS Bulletin · 2007 · 856 citations · Full text

Materials Science, Materials Engineering, Damage Mechanism +7

Nanoscale X-ray imaging

Anne Sakdinawat, David Attwood · Nature Photonics · 2010 · 696 citations

Nanoscale X-ray, Engineering, Microscopy +8

Focused Ion Beam Microscopy and Micromachining

Cynthia A. Volkert, Alexander Minor · MRS Bulletin · 2007 · 634 citations · Full text

Engineering, Microscopy, Microfabrication +4

Phase zone plates for x rays and the extreme uv

Janos Kirz · Journal of the Optical Society of America · 1974 · 379 citations

Optical Materials, X-ray Spectroscopy, Engineering +31

The X-ray microscopy beamline UE46-PGM2 at BESSY

R. Follath, Jan-Simon Schmidt, Markus Weigand et al. · AIP conference proceedings · 2010 · 36 citations

X-ray Crystallography, J. S. Schmidt, Art History +13