Journal of Applied Physics · 2006 · 27 citations · 21 references
EngineeringMaterials EngineeringMaterials ScienceSemiconductor DevicesSemiconductor MaterialsThin FilmsOptoelectronic DevicesOptoelectronic MaterialsPhotodetectorsSemiconductor Device MaterialsThin Film AnnealingThin Film Optical PropertiesAnnealingHall Effect MeasurementsLaser AnnealingMetal-semiconductor-metal PhotodetectorsOptical PropertiesPhotoluminescenceThin Oxide FilmsZinc Oxides
We report on the effect of postdeposition laser annealing of undoped zinc oxide (ZnO) thin films grown by laser assisted molecular beam deposition. Hall-effect measurements show that some undoped ZnO films change from n type with mobility values in the range of 200cm2V−1s−1 to p-type material with mobility value of 73cm2V−1s−1, after laser annealing. The photoconductive behavior was clearly seen on the laser-annealed samples, with values of 0.28mΩ−1. The structural and optical properties of the films were improved with laser annealing as shown by scanning electron microscopy, x-ray photoelectron spectroscopy analysis, and photoluminescence measurement. All of the nonlaser and laser annealed samples showed near-band emission at ∼3.3eV. Metal-semiconductor-metal photodetectors were fabricated from the films.
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