Semiconductor Science and Technology · 1998 · 21 citations · 5 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsCeramicsSurface SciencePorosity CharacterizationPorous CeramicsPorous MaterialsSemiconductor SurfacesSilicon MaterialsSurface PhysicsCathodoluminescence MicroscopyChannelsPorous SiliconPorous Silicon CarbideSilicon CarbideSilicon Carbide (Sic) MaterialsSilicon Carbide CeramicsStructural Characterization Of Porous Solids
The structure of porous silicon carbide has been studied using transmission electron microscopy both in planar geometry and in a cross-section of a porous film. Peculiar structures in the form of shared rosettes with petals of about 3-8 m in size and a density of were found in the subsurface layer. These formations are pierced by thin channels (pores) with an average diameter of 10 nm. Near the surface of the layer the channels in the `lobes' may be directed at small angles to the surface, but, with increasing depth, all of them become approximately perpendicular to the surface, with branching observed. On channel walls there is a rather thick layer of fine particles with characteristic dimensions of the order of 0.8-1.0 nm.
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Blue-green luminescence from porous silicon carbide
Takahiro Matsumoto, Jun Takahashi, Teruyuki Tamaki et al. · Applied Physics Letters · 1994 · 236 citations
Natural Sciences, Materials Engineering, Materials Science +17
Direct observation of porous SiC formed by anodization in HF
Joseph Shor, I. Grimberg, Ben-Zion Weiss et al. · Applied Physics Letters · 1993 · 162 citations
Natural Sciences, Materials Engineering, Materials Science +16