Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging

Invited article: The fast readout low noise camera as a versatile x-ray detector for time resolved dispersive extended x-ray absorption fine structure and diffraction studies of dynamic problems in materials science, chemistry, and catalysis

Jean-Claude Labiche, Olivier Mathon, S. Pascarelli et al. · Review of Scientific Instruments · 2007 · 384 citations

Seed-assisted cast quasi-single crystalline silicon for photovoltaic application: Towards high efficiency and low cost silicon solar cells

Xin Gu, Xuegong Yu, Kuanxin Guo et al. · Solar Energy Materials and Solar Cells · 2012 · 159 citations

Materials Science, Electrical Engineering, Engineering +11

Characterization of synthetic diamond crystals by spatially resolved rocking curve measurements

J. Hoszowska, Andreas K. Freund, E Boller et al. · Journal of Physics D Applied Physics · 2001 · 149 citations

Materials Science, Materials Engineering, Diamond-like Carbon +15

Growth of dislocation clusters during directional solidification of multicrystalline silicon ingots

Birgit Ryningen, Gaute Stokkan, Maulid Kivambe et al. · Acta Materialia · 2011 · 110 citations

Materials Engineering, Materials Science, Engineering +12

Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon

Jun Chen, Takashi Sekiguchi, Rong‐Jun Xie et al. · Scripta Materialia · 2005 · 101 citations

Electrical Engineering, Semiconductor Device, Engineering +7