Physica B Condensed Matter · 2003 · 16 citations · 14 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesEtching ProcessesSemiconductor Device MaterialsSemiconductor ReliabilitySurface PassivationWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsEtch DamageEtchingReactive Ion Etching
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Optical properties of Si-doped GaN
E. Fred Schubert, I. D. Goepfert, W. Grieshaber et al. · Applied Physics Letters · 1997 · 214 citations
Depth and thermal stability of dry etch damage in GaN Schottky diodes
X. A. Cao, H. Cho, S. J. Pearton et al. · Applied Physics Letters · 1999 · 146 citations
Plasma-induced damage to <i>n</i>-type GaN
H. W. Choi, S. J. Chua, A. Raman et al. · Applied Physics Letters · 2000 · 92 citations