Concepedia

Temperature control system for the study of single event effects in integrated circuits using a cyclotron accelerator

Alexander S. Bakerenkov, V.V. Belyakov, Alexander E. Kozyukov, A.V. Solomatin, V.V. Shurenkov

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2014 · 10 citations · 5 references

DOI

Concepts

References

5

IEEE Transactions on Nuclear Science

IEEE Transactions on Nuclear Science · 1982 · 115 citations

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Single event latchup threshold estimation based on laser dose rate test results

A. I. Chumakov, Andrey N. Egorov, O.B. Mavritsky et al. · IEEE Transactions on Nuclear Science · 1997 · 32 citations

, , +17

IC’s radiation effects modeling and estimation

V.V. Belyakov, A. I. Chumakov, A.Y. Nikiforov et al. · Microelectronics Reliability · 2000 · 20 citations

, , +5

Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods

Maxim S. Gorbunov, Boris V. Vasilegin, Andrey A. Antonov et al. · IEEE Transactions on Nuclear Science · 2012 · 17 citations

, , +22

Modeling rail-span collapse in ICs exposed to a single radiation pulse

A. I. Chumakov · Russian Microelectronics · 2006 · 16 citations