Fatigue mechanism of the ferroelectric perovskite thin films

Abstract

Incorporating the vacancy electromigration theory into the switching-induced charge-injection mechanism into the local phase decomposition model has led to an analytical model for the dielectric fatigue behavior and the remnant polarization in perovskite structured ferroelectric thin films. The model has allowed us to reproduce the fatigue behavior in various ferroelectric thin films measured under different voltages, temperatures, and frequencies. We concluded the essential reason for electrical fatigue in ferroelectrics is the local phase separation induced directly or indirectly by other fatigue mechanisms proposed in previous papers.