Interface trap properties of thermally oxidized n-type 4H–SiC and 6H–SiC - Concepedia

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Interface trap properties of thermally oxidized n-type 4H–SiC and 6H–SiC

81

Citations

23

References

2005

Year

Tamara Rudenko, I.N. Osiyuk, I.P. Tyagulski, H.Ö. Ólafsson, E.Ö. Sveinbjörnsson

Solid-State Electronics

Materials EngineeringMaterials ScienceElectrical EngineeringEngineeringApplied PhysicsInterface Trap PropertiesStructural CeramicCarbide

References

	Year	Citations

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