1998 · 283 citations · 20 references
EngineeringComputer ScienceElectrical EngineeringComputer ArchitectureMicroelectronicsSemiconductor DevicesError DetectionSubthreshold Circuit Design
Article Free Access Share on Getting to the bottom of deep submicron Authors: Dennis Sylvester University of California, Berkeley Electrical Engineering and Computer Sciences University of California, Berkeley Electrical Engineering and Computer SciencesView Profile , Kurt Keutzer University of California, Berkeley Electrical Engineering and Computer Sciences University of California, Berkeley Electrical Engineering and Computer SciencesView Profile Authors Info & Claims ICCAD '98: Proceedings of the 1998 IEEE/ACM international conference on Computer-aided designNovember 1998 Pages 203–211https://doi.org/10.1145/288548.288614Online:01 November 1998Publication History 125citation652DownloadsMetricsTotal Citations125Total Downloads652Last 12 Months24Last 6 weeks3 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF
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A 160-MHz, 32-b, 0.5-W CMOS RISC microprocessor
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Full copper wiring in a sub-0.25 μm CMOS ULSI technology
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