Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors

Abstract

Frequency modulation atomic force microscopy (FM-AFM) imaging in ionic liquids (ILs) were carried out. A quartz tuning fork sensor with a sharpened tungsten tip was used as a force sensor instead of a Si cantilever. Only the tip apex was immersed in ILs and the quality factor of the sensors was kept more than 100 in spite of the high viscosity of ILs. Atomic-resolution topographic imaging was successfully achieved in an IL as well as in an aqueous solution. In addition, frequency shift versus tip-to-sample distance curves were obtained and the structures of local solvation layers were studied.