International Journal of Electronics · 1971 · 12 citations · 4 references
EngineeringElectrical EngineeringMicroelectronicsMicrowave EngineeringSemiconductor DevicesDevice ModelingDevice SimulationMicrowave Integrated CircuitsMicrowave OscillatorsMicrowave Semiconductor DevicesNoise In Semiconductor DevicesDiode Circuit AnalysisDiode ModelingMicrowave Circuit ModelingMultiplication NoisePunch-throughTransit-time Devices
The non-linearity of the punch-through-injection characteristic is used for the realization of a transit-time microwave oscillator diode. By modulating the height of a potential barrier situated at one end of the drift region of the device, a sharp injection of charge is effected periodically, but without the multiplication noise inherent in the operation of the avalanche transit-time diode. The injected charge, including the effect of mobile space-charge, and the resulting external circuit current, are analysed numerically, using a simplified three-layer silicon PNP structure. It is shown that it is possible to achieve efficiencies of the order of 10%.
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