IEEE Transactions on Electron Devices · 1989 · 64 citations · 31 references
Laser Frequency VPhotonicsElectrical EngineeringEngineeringLaser SciencePhysicsTunneling TimeOptical PropertiesTunneling MicroscopyApplied PhysicsCurrent RectificationInstrumentationMicroelectronicsLaser FrequencyHigh-power LasersStm Tunnel JunctionOperational Tunneling Time
The effects of material, thermal, and geometrical asymmetries on the nonlinearity of the I-V characteristics of a scanning tunneling microscope (STM) tunneling junction are investigated theoretically and experimentally. As a consequence of the nonlinearity, an STM junction can rectify an incident laser beam to produce both DC and AC tunneling current components. Using the dependence of the DC rectified current on the tip-sample distance s and the laser frequency v, an operational definition of a tunneling time is proposed. An experiment using a laser-irradiated STM junction is also performed to measure the rectified current as a function of s, for a fixed v. From the preliminary results of this experiment, a tunneling time on the order of 1.8 fs is determined. This time is in reasonable agreement with those obtained in other experimental and theoretical studies of tunneling junctions of comparable dimensions and energies. It is also shown that the AC current contains components at the laser frequency and its higher harmonics. This implies that the STM junction can be used as a nonlinear device to detect, generate, and measure laser frequency harmonics.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Theory and Application for the Scanning Tunneling Microscope
J. Tersoff, D. R. Hamann · Physical Review Letters · 1983 · 2.5K citations · Full text
Rolf Landauer · Physical Review Letters · 1982 · 1.1K citations
Thomas E. Hartman · Journal of Applied Physics · 1962 · 799 citations
Rolf Landauer · IBM Journal of Research and Development · 1986 · 694 citations