The physics of ONO layer dielectrics

Gap states in silicon nitride

J. David Robertson, Martin J. Powell · Applied Physics Letters · 1984 · 437 citations

Natural Sciences, Materials Science, Physics +17

A true single-transistor oxide-nitride-oxide EEPROM device

T.Y. Chan, K.K. Young, Chenming Hu · IEEE Electron Device Letters · 1987 · 85 citations

Engineering, Electrical Engineering, Materials Science +17

Electronic processes in silicon nitride

Stefano Manzini · Journal of Applied Physics · 1987 · 51 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Lifetime of thin oxide and oxide-nitride-oxide dielectrics within trench capacitors for DRAMs

P. Hiergeist, A. Spitzer, S. Röhl · IEEE Transactions on Electron Devices · 1989 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Charge transport and trapping in silicon nitride-silicon dioxide dielectric double layers

Stefano Manzini, F. Volonté · Journal of Applied Physics · 1985 · 33 citations

Engineering, Electrical Engineering, Materials Science +17