Solid-State Electronics · 1977 · 33 citations · 16 references
EngineeringComputer EngineeringComputer ScienceMetrologyCalibrationCurve FittingDevice CharacterizationDevice CalibrationEtch Profile ControlPeak Profile AnalysisProfile MeasurementSurface Profile Measurement
16
Theory of Impurity Scattering in Semiconductors
E. M. Conwell, V. F. Weisskopf · Physical Review · 1950 · 931 citations
Drift and Conductivity Mobility in Silicon
Günther Ludwig, Robert L. Watters · Physical Review · 1956 · 229 citations