Profile Measurement is a dimensional metrology technique that characterizes the deviation of a physical surface’s cross-sectional geometry from its intended design by quantitatively assessing the spatial coordinates of points along a defined path, distinguishing itself from other form measurements through its focus on two-dimensional, line-based geometric fidelity.
401
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76
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Profile Metrology
Publications
401
On Methods in the Analysis of Profile Data
Samuel W. Greenhouse, Seymour Geisser · Psychometrika · 1959 · 5K citations
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Authors
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- WG
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1–5 of 1.4K
Institutions
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Tohoku University
Sendai, Japan
12 h-index
53 publications
1.5K citations
Tsinghua University
Beijing, China
11 h-index
34 publications
1.1K citations
The University of Tokyo
Tokyo, Japan
11 h-index
39 publications
896 citations
National Institute for Fusion Science
Toki, Japan
9 h-index
49 publications
901 citations
National University of Singapore
Singapore, Singapore
9 h-index
25 publications
704 citations
Physikalisch-Technische Bundesanstalt
Braunschweig, Germany
7 h-index
16 publications
570 citations
Huazhong University of Science and Technology
Wuhan, China
7 h-index
14 publications
324 citations
Brookhaven National Laboratory
Upton, United States
6 h-index
13 publications
447 citations
1–8 of 392
Venues
- Applied Optics
23 publications · 1.2K citations
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- Measurement Science and Technology
17 publications · 534 citations
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- Review of Scientific Instruments
15 publications · 466 citations
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- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
22 publications · 379 citations
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- Precision Engineering
12 publications · 455 citations
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