Applied Physics Letters · 2003 · 384 citations · 10 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsOptical DetectorsOptoelectronic DevicesOptoelectronic MaterialsPhotodetectorsSemiconductor DetectorsUltraviolet DetectorsBand GapOptical Band GapPhotodiodesPhotoelectric EffectReverse Bias CharacteristicsSilicon PhotodiodesUltraviolet PhotodetectorsVisible Radiation
We report on the photoelectric properties of n-ZnO/p-Si photodiodes which detect UV photons in the depleted n-ZnO and simultaneously detect visible photons in the depleted p-Si. As characterized by I–V measurements in the photon range of 310 to 650 nm our photodiodes exposed to UV photons show a linear increase in photocurrent with reverse bias. In the visible range, the photocurrent rises rapidly with bias but saturates beyond a critical voltage. Our diodes exhibit strong responsivities of 0.5 and 0.3 A/W for UV (310-nm) and red (650-nm) photons, respectively, under a 30-V bias with a weak minimum near 380 nm, the wavelength corresponding to the band gap of ZnO. It is concluded that our n-ZnO/p-Si diode can be a UV-enhanced photodiode that simultaneously detects UV and visible photons by employing two related photoelectric mechanisms in parallel.
10
Semiconductor ultraviolet detectors
Manijeh Razeghi, Antoni Rogalski · Journal of Applied Physics · 1996 · 1.5K citations
ZnO Schottky ultraviolet photodetectors
S. Liang, H. Sheng, Y. Liu et al. · Journal of Crystal Growth · 2001 · 906 citations
High-quality visible-blind AlGaN <i>p-i-n</i> photodiodes
E. Monroy, M. Hamilton, D. Walker et al. · Applied Physics Letters · 1999 · 143 citations