IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1987 · 209 citations · 21 references
EngineeringComputer EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesBoolean AlgebraBoolean Network ModelsCmos Circuit DesignDevice ModelingDigital Logic DesignLogic SynthesisBoolean EquationsCharge StorageCmos Logic CircuitsCurrent-state ModelingFault SimulationPass-transistor LogicSymbolic VerificationTest Generation
The switch‑level model represents a digital MOS circuit as a network of charge‑storage nodes linked by resistive transistor switches, whose functionality can be expressed as Boolean equations. Solving these equations symbolically yields Boolean formulas that map inputs and the current state to new network states. The symbolic analysis produces formulas that, like MOSSIM II, support bidirectional effects and X logic, have worst‑case O(n³) complexity but typically O(n), and provide a foundation for efficient logic simulation, fault simulation, test generation, and symbolic verification.
The switch-level model represents a digital metal-oxide semiconductor (MOS) circuit as a network of charge storage nodes connected by resistive transistor switches. The functionality of such a network can be expressed as a series of systems of Boolean equations. Solving these equations symbolically yields a set of Boolean formulas that describe the mapping from input and current state to the new network states. This analysis supports the same class of networks as the switch-level simulator MOSSIM II and provides the same functionality, including the handling of bidirectional effects and indeterminate (X) logic values. In the worst case, the analysis of an n-node network can yield a set of formulas containing a total of O(n /sup 3/) operations. However, all but a limited set of dense, pass-transistor networks give formulas with O(n) total operations. The analysis can serve as the basis of efficient programs for a variety of logic design tasks, including logic simulation (on both conventional and special-purpose computers), fault simulation, test generation, and symbolic verification.
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Concurrent simulation of nearly identical digital networks
The design and analysis of VLSI circuits
G.W.A.D. · Microelectronics Reliability · 1986 · 219 citations
Engineering, Computer Engineering, Electrical Engineering +12
The Yorktown Simulation Engine
Monty Denneau · 1982 · 131 citations