Microelectronics Reliability · 2010 · 17 citations · 20 references
Ultraviolet Light ExposureElectrical EngineeringShort Wavelength OpticEngineeringNanoelectronicsOptical PropertiesApplied PhysicsOptical SwitchingHfox FilmMicroelectronicsOptoelectronicsAbnormal Resistive Switching
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Improvement of resistive memory switching in NiO using IrO2
D. C. Kim, Myoung‐Jae Lee, Seung‐Eon Ahn et al. · Applied Physics Letters · 2006 · 193 citations