Microelectronics Reliability · 2010 · 17 citations · 20 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesPhotodetectorsThin Film Optical PropertiesLight ExposureLight-induced DamageResistive SwitchingResistive Switching MaterialsUltraviolet Light EffectsUltraviolet Light Exposure
20
Improvement of resistive memory switching in NiO using IrO2
D. C. Kim, Myoung‐Jae Lee, Seung‐Eon Ahn et al. · Applied Physics Letters · 2006 · 193 citations
Natural Sciences, Materials Engineering, Materials Science +16