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Publication | Closed Access

Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress

DOI

28

Citations

16

References

2013

Year

Laurent Brunel, Benoît Lambert, P. Mezenge, J. Bataille, D. Floriot, Jan Grünenpütt, H. Blanck, Dominique Carisetti, Y. Gourdel, N. Malbert,
Microelectronics Reliability

References

YearCitations

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