IEEE Design & Test of Computers · 2011 · 12 citations · 27 references
Reliability IssuesElectrical EngineeringReview ArticleEngineeringVlsi DesignCircuit DesignFlexible ElectronicsNanoelectronicsCircuit SystemMechanical SystemsComputer EngineeringElectronic DesignCircuit ReliabilityElectronic PackagingMicroelectronicsClassic Silicon CmosRobust Circuit Design
In this review article, the authors survey several thin-film transistor (TFT) technologies for flexible electronics of the future. The review's focus centers on the reliability issues of these new devices compared to those of classic silicon CMOS. In addition, the article examines different digital and analog design techniques, which are discussed within the context of robust circuit design.
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Ultralow-power organic complementary circuits
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Organic Charge-transfer Compound, Electrical Engineering, Engineering +4
A hemispherical electronic eye camera based on compressible silicon optoelectronics
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