Journal of Physics D Applied Physics · 1974 · 24 citations · 3 references
Optical SignaturesEngineeringMicroscopyElectron DiffractionElectron OpticSurface ReflectanceElectron MicroscopyMicroscopy MethodOptical PropertiesIntensity DistributionsComputational ElectromagneticsPhysicsDiffractionFresnel FringesSuper-resolutionElectron BeamApplied PhysicsElectron MicroscopeDiffractive Optic
Intensity distributions of Fresnel fringes are calculated from a consideration of various specimen edge cross sections, where the penetration power and the phase shift of the electron beam are continuously varied with distance from the specimen edge.
3