Electron Beam Optics
Electron Beam Optics is the systematic study and application of electromagnetic and electrostatic fields to control the trajectory, focus, and spatial distribution of a collimated electron beam in transmission electron microscopy, distinguishing it from other beam manipulation techniques by its reliance on lens-like elements to achieve high-resolution imaging and diffraction analysis.
1.8K
Publications
75.4K
Citations
4.9K
Authors
973
Institutions
Publications per year
2017–2026
175
Variants
Electron Optics
1.8K
The Theoretical Resolution Limit of the Electron Microscope
Otto Scherzer · Journal of Applied Physics · 1949 · 916 citations
Sub-ångstrom resolution using aberration corrected electron optics
Philip E. Batson, Niklas Dellby, Ondrej L. Krivanek · Nature · 2002 · 899 citations
Photon-induced near-field electron microscopy
Brett Barwick, David J. Flannigan, Ahmed H. Zewail · Nature · 2009 · 771 citations
1–5 of 1.8K
4.9K
17
h-index
15
h-index
14
h-index
13
h-index
12
h-index
1–5 of 4.9K
973

Lawrence Berkeley National Laboratory
Berkeley, United States
25 h-index
94 publications
9.5K citations

Centre National de la Recherche Scientifique
Paris, France
24 h-index
141 publications
6.6K citations
Arizona State University
Tempe, United States
23 h-index
74 publications
3.1K citations
Stanford University
Stanford, United States
22 h-index
116 publications
4.3K citations

Brookhaven National Laboratory
Upton, United States
20 h-index
98 publications
4.2K citations
Hitachi (Japan)
Tokyo, Japan
20 h-index
158 publications
5.5K citations
RCA (United States)
New York, United States
19 h-index
57 publications
2.1K citations
Massachusetts Institute of Technology
Cambridge, United States
19 h-index
86 publications
2.7K citations
1–8 of 973
148 publications · 8.1K citations
48
h-index
PRL · 69 publications · 5.8K citations
45
h-index
73 publications · 3.9K citations
32
h-index
82 publications · 3.9K citations
32
h-index
78 publications · 2.9K citations
32
h-index
1–5