Observation of negative differential resistance of a trench-type narrow InGaAs quantum-wire field-effect transistor on a (311)A InP substrate

Takeyoshi Sugaya, Mutsuo Ogura, Yoshinobu Sugiyama, Kazuyuki Matsumoto, Kenji Yonei, Kee-Youn Jang

Applied Physics Letters · 2001 · 13 citations · 10 references

Concepts

Abstract

A trench-type narrow InGaAs quantum-wire field-effect transistor (QWR–FET) with a cross section of 8×25 nm has been fabricated on a (311)A InP V-grooved substrate by molecular-beam epitaxy. The trench-type InGaAs QWR–FET has normal static characteristics at room temperature, and demonstrates clear negative differential resistance characteristics at 40 K with a high peak-to-valley current ratio (PVR=4.3) and a low onset voltage of 0.12 V.

References

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