Publication | Closed Access
Impact of back biasing on carrier transport in ultra-thin-body and BOX (UTBB) Fully Depleted SOI MOSFETs
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Citations
4
References
2012
Year
Unknown Venue
Electrical EngineeringEngineeringUltra-thin BodyCarrier Transport BehaviorNanoelectronicsElectronic EngineeringBack BiasingApplied PhysicsCarrier TransportBias Temperature InstabilitySoi MosfetsMicroelectronicsSemiconductor Device
A comprehensive study of the impact of back biasing on carrier transport behavior in Ultra-Thin Body and BOX (UTBB) Fully Depleted SOI (FD-SOI) MOSFETs and its implications for deeply scaled device performance is presented.
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