Concepedia

Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography

T. Kinno, Haruko Akutsu, M. Tomita, S. Kawanaka, Takeshi Sonehara, A. Hokazono, L Renaud, I Martin, Rabah Benbalagh, B. Sallé,

Applied Surface Science · 2012 · 16 citations · 13 references

DOI

Concepts

References

13

Field ion image formation

Tien T. Tsong · Surface Science · 1978 · 343 citations

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Atom Probe Tomography of Electronic Materials

Thomas F. Kelly, David J. Larson, Keith Thompson et al. · Annual Review of Materials Research · 2007 · 218 citations

, , +16

Quantitative atom probe analysis of carbides

Mattias Thuvander, Jonathan Weidow, Jenny Angseryd et al. · Ultramicroscopy · 2010 · 185 citations

, , +8

Design of a delay-line position-sensitive detector with improved performance

G. Da Costa, F. Vurpillot, A. Bostel et al. · Review of Scientific Instruments · 2004 · 172 citations · Full text

, , +15

Correlated field evaporation as seen by atom probe tomography

Frédéric De Geuser, Baptiste Gault, A. Bostel et al. · Surface Science · 2006 · 122 citations · Full text

, , +9