Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography - Concepedia

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Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography

16

Citations

13

References

2012

Year

T. Kinno, Haruko Akutsu, M. Tomita, S. Kawanaka, Takeshi Sonehara, A. Hokazono, L Renaud, I Martin, Rabah Benbalagh, B. Sallé,

Applied Surface Science

Materials ScienceEngineeringPhysicsMicroscopyNatural SciencesSpectroscopyNiptsi Thin FilmApplied PhysicsScanning Probe MicroscopyMulti-hit CapabilityMicroanalysisNanometrologyInstrumentationThin FilmsQuantitative Measurement

References

	Year	Citations

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