IEEE Journal of Solid-State Circuits · 1988 · 12 citations · 3 references
Low-power ElectronicsElectrical EngineeringAutomatic PlacementEngineeringVlsi DesignHigh-speed Electronics32-B RiscMulti-channel Memory ArchitectureComputer ArchitectureComputer EngineeringCmos TechnologyIntegrated Circuits200-Ps Gate DelayMicroelectronicsBeyond CmosOptoelectronicsK Cmos ArrayElectronic Circuit
A 20 K NAND2 equivalent CMOS gate array prototype with 0.5- mu m channel length FETs is described. The 7.5*7.5-mm chip is designed for high performance with 200-ps gate delay. Large macros such as a 32-b RISC (reduced instruction-set computer) processor and 128*8 SRAM (static random-access memory) have been implemented with automatic placement and wiring tools. Their respective predicted performances of 17-ns cycle and 6.1-ns access time have been verified. This confirms that the speed of complex functions in half-micrometer-channel-length CMOS technology is getting close to the speed achieved by current bipolar hardware.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
3
A half micron MOSFET using double implanted LDD
S. Ogura, C.F. Codella, N. Rovedo et al. · 1982 · 57 citations
LSI chip design for testability
Sumit DasGupta, E. B. Eichelberger, T.W. Williams · 1978 · 30 citations
Hardware Security, Lsi Chip Design, Electrical Engineering +14