Probing more than the surface

Abstract

Nanoindentation is a powerful method for quantitative mechanical property determination ideally suited for measuring small scale and thin film materials. The unique and complimentary capabilities of atomic force microscopy (AFM) and nanoindentation in combination have enabled the development of nanomaterials research to be brought to the forefront in recent years. The more recent advancement of in-situ scanning probe microscopy (SPM) imaging, where the nanoindenter tip is simultaneously used as a 3D imaging device combined with nanoindentation has enabled a new wave of novel materials research to progress.