P‐14: a‐Si Robust Gate Driver for 7.0‐in. WVGA LCD Panel

Abstract

Abstract We proposed an Hydrogenated amorphous silicon thin film transistors (a‐Si:H TFT) robust gate driver on glass substrate for the 7‐inch WVGA TFT‐LCD panel. By utilizing the specific design technique, the threshold voltage (V th ) shift of the a‐Si TFT in the gate driver can be compensated. Under reliability simulations, the gate driver can operates correctly over 8 days in 80 °C, although the V th increased to ten times of the initial value. The integrated a‐Si TFT gate driver can effectively reduce the cost of TFT‐LCD manufacturing in the future.