Nanotechnology · 2006 · 22 citations · 24 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationNanomaterialsSemiconductor MaterialsEpitaxial GrowthNanomaterial CharacterizationNanoscale MaterialsSemiconductor Crystal GrowthSemiconductor NanomaterialsX-ray DiffractionMolecular Beam EpitaxyNanorodsOptical PropertiesSemiconductor NanorodsX-ray Diffraction Analysis
Hexagonal Al(x)Ga(1-x)N nanorods were grown by plasma-assisted molecular beam epitaxy (PAMBE) on Si(001) substrates. The Al mole fraction was determined from x-ray diffraction (XRD) measurement and its value was varied from 0 to 15. It is found that, under group III-rich conditions, the growth rate of the Al(x)Ga(1-x)N nanorods decreases and the diameter increases due to the possibility of incorporation of aluminium and gallium. In order to study structural and optical properties, x-ray diffraction and cathodoluminescence (CL) measurements were carried out. The Al content (x) is calculated from these measurements and their values are compared.
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Nitride-based semiconductors for blue and green light-emitting devices
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Single-crystal gallium nitride nanotubes
Joshua E. Goldberger, Rongrui He, Yanfeng Zhang et al. · Nature · 2003 · 1.2K citations