Physical properties of SIO2 thin films obtained by anodic oxidation

Low-temperature growth of silicon dioxide films: A study of chemical bonding by ellipsometry and infrared spectroscopy

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Spectroscopic evidence for valence-alternation-pair defect states in vitreous SiO₂

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On the Origin of Electrochemical Oscillations at Silicon Electrodes

V. Lehmann · Journal of The Electrochemical Society · 1996 · 76 citations

Natural Sciences, Chemistry, Materials Science +17